Method for screening low temperature resistance indexes of corn in germination stage
作者： Zhou Yu , Zhang Hong , Wang Dandan , Wang Zhenhua , Zeng Xing
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摘要: The invention belongs to the technical field of temperature index screening corn in germination stage, and discloses a method for low resistance indexes stage. 4DEG C, 6DEG 8DEG 10DEG C 12DEG C; CK25DEG 5d; 7d are used orthogonal tests determine best treatment combination identification indexes; evaluation standards self cross lines stage established; rate, vigor data analyzed find ratios measured values all traits at normal as indexes. Damage caused by THE growth seeds can be reduced, strong guarantee development period us provided, lays foundation large-scale resistant maize germplasm.
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