作者: Jozefina Katić , Mirjana Metikoš-Huković , Ingrid Milošev
DOI: 10.1149/2.0691514JES
关键词:
摘要: The surface film that forms on pure Ni during potentiostatic anodic polarization in a slightly alkaline solution was investigated by transient electrochemical techniques combination with cyclic voltammetry, impedance spectroscopy (EIS) and X-ray photoelectron (XPS). Point Defect Model combined charge approach interfacial capacity measurements used to explore correlation between semiconducting properties (electronic conductivity) kinetics of the formation (ionic conductivity). Transport cation vacancies, as dominant point defects, through is rate-determining step overall process growth. diffusion coefficient vacancies extracted from low-frequency EIS data dc measurements. formed found be p-type semiconductor. flat band potential carrier density were corrected for frequency dispersion. composition films nickel, elemental identification chemical state elements obtained using XPS.