Testing method and apparatus assuring semiconductor device quality and reliability

摘要: An automatic test apparatus for assuring quality and reliability of semiconductor integrated circuit devices comprising a computerized tester controller performing virtual timing, formatting, pattern generation testing said devices; head controlled by the controller, pin electronics, dc subsystem, support self-testing built into circuit. The comprises sequence control, memory, scan timing system driver signal formatter, thereby executing virtually high speed functional tests based on patterns, combined with ac parametric devices. Furthermore, dynamically transforms data stored in computer instructions matched to digital function stimulus response required design