The operator model for X-ray fluorescence and its application to inter-element effect corrections in XRF analysis
作者： Zbigniew W. Werfel
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摘要: A new empirical mathematical method for inter-element effect corrections in XRF analysis is presented. It based on a special theoretical description of phenomena called OMX (operator model x-ray fluorescence), presuming discrete layer the sample structure and using operators to describe interaction between layers exciting radiation. The formed generally as spectral distributions may be simplified into matrix form practical application. effectiveness proposed was verified experimentally by analysing samples glass raw materials.
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sci-hub.se 参考文章(4)
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