Identification of deformation behavior in high-thermal-resistant poly(acrylonitrile-butadiene-styrene) (ABS)
作者： P.-Y. Ben Jar , R. Lee , D. C. Creagh , K. Konishi , T. Shinmura
DOI: 10.1002/APP.1556
关键词:
摘要: Deformation mechanisms in postfractured high-thermal-resistant poly(acrylonitrile-butadiene-styrene) (ABS) were investigated using transmission electron microscopy (TEM) and small-angle X-ray scattering (SAXS). Although crazes clearly identified by TEM, they not detectable SAXS. This was possibly due to a short distance between sample imaging plate the SAXS set-up invisibility of craze fibril from samples. A rhomboid-shaped pattern obtained ABS samples with high ductility but no shown TEM micrographs. It is believed that generated matrix shear yielding. The results show combination enable us distinguish crazing yielding ABS. © 2001 John Wiley & Sons, Inc. J Appl Polym Sci 81: 1316–1321,
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