Vacuum-actuated top access test probe fixture

摘要: A top access test probe fixture (10) for use with a vacuum-actuated primary (12) includes block (70) supported reciprocal movement on contact board (54) mounted the movable platen (28) of fixture. The is actuated through bellows (86) disposed between and (54), which are connected in fluid communication vaccum chamber so that simultaneously responsive to actuation Contacts (102) provided engagement probes (104) (100) by leads (106) other (108) adapted predetermined points circuit under avoid bending thus fatigue breakage wires during operation.