An alternative scheme to measure single-point hysteresis loops using piezoresponse force microscopy

摘要: Abstract We present a simple and low cost procedure to obtain the electromechanical response, in single-point, of non-conductive materials. The technique makes use amplitude modulated voltage pulses an atomic force microscope with standard configuration. Material response obtained, as signals phase from lock-in amplifier well input signal introduced conductive tip are stored AFM images, which act like data acquisition system. acquired processed free - program that eliminates necessity constant time-widths, enabling system study domain stability piezo- ferro-electric provide electronic circuit diagram, flowcharts, software for implementation execution this procedure. Our goal is alternative scheme measure strain-hysteretic behavior nonconductive materials without need invest expensive or AFM-moduli.