作者: Umar Khan , Mark French , Harold Chong
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摘要: The objective of this contribution is to report a low cost implementation control system for an atomic force microscope (AFM). AFMs rely on feedback controller as integral part their operation. Currently the controllers shipped with most commercial are implemented in closed source manner and provide limited signal access. This restricts development novel strategies by end users. solution reported uses commonly available Digital Signal Processor kit implement Proportional Integral (PI) controller. tested AFM experimental results reported.