Real time controller implementation for an atomic force microscope using a Digital Signal Processor

作者: Umar Khan , Mark French , Harold Chong

DOI:

关键词:

摘要: The objective of this contribution is to report a low cost implementation control system for an atomic force microscope (AFM). AFMs rely on feedback controller as integral part their operation. Currently the controllers shipped with most commercial are implemented in closed source manner and provide limited signal access. This restricts development novel strategies by end users. solution reported uses commonly available Digital Signal Processor kit implement Proportional Integral (PI) controller. tested AFM experimental results reported.

参考文章(20)
Abu Sebastian, Nanotechnology: a systems and control approach Iowa State University. ,(2004) , 10.31274/RTD-180813-16502
Daniel James Burns, A system dynamics approach to user independence in high speed atomic force microscopy Massachusetts Institute of Technology. ,(2010)
S. Iyer, R. M. Gaikwad, V. Subba-Rao, C. D. Woodworth, Igor Sokolov, Atomic force microscopy detects differences in the surface brush of normal and cancerous cells. Nature Nanotechnology. ,vol. 4, pp. 389- 393 ,(2009) , 10.1038/NNANO.2009.77
Yifan Sun, Yongchun Fang, Yudong Zhang, Xiaokun Dong, Field programmable gate array (FPGA) based embedded system design for AFM real-time control international conference on control applications. pp. 245- 250 ,(2010) , 10.1109/CCA.2010.5611277
Daniel Y. Abramovitch, Storrs Hoen, Richard Workman, Semi-automatic tuning of PID gains for Atomic Force Microscopes american control conference. pp. 2684- 2689 ,(2008) , 10.1109/ACC.2008.4586898
G. Aloisi, F. Bacci, M. Carlà, D. Dolci, L. Lanzi, Implementation on a desktop computer of the real time feedback control loop of a scanning probe microscope. Review of Scientific Instruments. ,vol. 79, pp. 113702- 113702 ,(2008) , 10.1063/1.2992483
Qinmin Yang, S. Jagannathan, Atomic force microscope-based nanomanipulation with drift compensation International Journal of Nanotechnology. ,vol. 3, pp. 527- 544 ,(2006) , 10.1504/IJNT.2006.011177
Miłosz Grodzicki, Szymon Smolarek, Piotr Mazur, Stefan Zuber, Antoni Ciszewski, Characterization of Cr/6H-SiC(0 0 0 1) nano-contacts by current-sensing AFM Applied Surface Science. ,vol. 256, pp. 1014- 1018 ,(2009) , 10.1016/J.APSUSC.2009.05.140
Ute Drechsler, Michel Despont, Tilo Jankowski, Martin Tschöpe, Bart W. Hoogenboom, Carl Leung, Aizhan Bestembayeva, Richard Thorogate, Jake Stinson, Alice Pyne, Christian Marcovich, Jinling Yang, Atomic force microscopy with nanoscale cantilevers resolves different structural conformations of the DNA double helix. Nano Letters. ,vol. 12, pp. 3846- 3850 ,(2012) , 10.1021/NL301857P
M. Guthold, M. Bezanilla, D. A. Erie, B. Jenkins, H. G. Hansma, C. Bustamante, Following the assembly of RNA polymerase-DNA complexes in aqueous solutions with the scanning force microscope Proceedings of the National Academy of Sciences of the United States of America. ,vol. 91, pp. 12927- 12931 ,(1994) , 10.1073/PNAS.91.26.12927