Direct and Parallel Tomography of a Quantum Process

摘要: As the method to completely characterize quantum dynamical processes, process tomography (QPT) is vitally important for information processing and control, where faithfulness of devices plays an essential role. Here via weak measurements, we present a new QPT scheme characterized by its directness parallelism. Comparing with existing schemes, our needs simpler state preparation much fewer experimental setups. Furthermore, each parameter directly determined from only five values in scheme, meaning that robust against accumulation errors.