Strain And Dislocation Gradients From Diffraction: Spatially-resolved Local Structure And Defects

摘要: Diffraction Analysis of Defects - State the Art X-Ray Laue Microscopy in 3D at Advanced Photon Source High Energy Transmission Micro-Beam XMAS: A Versatile Tool for Analyzing Synchrotron Microdiffraction Data ESRF Grain Centre Mapping 3DXRD Measurements Average Characteristics Three Dimensional Imaging Techniques Resolution Reciprocal Space Characterizing Deformation Structures Reconstructing 2D & Orientation Maps from White Beam Energy-Variable Studying Polycrystalline Materials with Depth Microstructure Detail Extraction via EBSD: An Overview Pressure Studies Microdiffraction.