A beta model for estimating the testability and coverage distributions of a VLSI circuit
作者： H.A. Farhat , S.G. From
DOI: 10.1109/43.229738
关键词:
摘要: A relation between fault coverage and testability is employed to predict population coverage. The profile modeled as a mixture of discrete impulse function continuous beta distribution. parameters the distribution are estimated from data obtained on sample faults. chosen due its flexible nature. computed values dependent input vectors. Experimental results three large ISCAS-89 circuits reflect accuracy Applications presented work include test generation by sampling, estimation, length predictions. >
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