A stochastic algorithm for reconstruction of grain maps of moderately deformed specimens based on X‐ray diffraction

摘要: In a recent paper [Alpers, Poulsen, Knudsen & Herman (2006). J. Appl. Cryst. 39, 582–588] stochastic algorithm was presented for reconstruction of grain maps undeformed polycrystals based on X-ray diffraction data. Here the formalism is extended to moderately deformed specimens. Each two-dimensional section specimen reconstructed independently. Using dual assignment label and an orientation each pixel in prior model methods discrete tomography, our converges few minutes 64\times64 map. Simulations with higher than typical levels noise data collection three microstructures resulted fraction erroneously assigned pixels being 1.7% or much less.