作者: Yang Yang , Qiang Fu , Mingming Wei , Hendrik Bluhm , Xinhe Bao
DOI: 10.1007/S12274-014-0639-0
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摘要: Hexagonal boron nitride (h-BN) is often prepared by epitaxial growth on metals, and stability of the formed BN/metal interfaces in gaseous environment a key issue for physicochemical properties BN overlayers. As an illustration here, structural change BN/Ru(0001) interface upon exposure to O2 has been investigated using situ photoemission electron microscopy (PEEM) ambient pressure X-ray photoelectron spectroscopy (AP-XPS). We demonstrate occurrence oxygen intercalation overlayers atmosphere, which decouples overlayer from substrate. Comparative studies at graphene/Ru(0001) surfaces indicate that happens more easily than graphene. This finding will be importance future applications BN-based devices materials under conditions. Open image new window