A superbright X‐ray laboratory microsource empowered by a novel restoration algorithm

摘要: The properties of nanoscale materials vary with the size and shape building blocks, which can be measured by (grazing-incidence) small-angle X-ray scattering along mutual positions nanoparticles. accuracy in determination such parameters is dependent on signal-to-noise ratio pattern visibility interference fringes. Here, a first-generation-synchrotron-class laboratory microsource was used combination new restoration algorithm to probe nanoscale-assembled superstructures. proposed algorithm, based maximum likelihood approach, allows one deconvolve beam-divergence effects from data restore, at least partially, missing cut away beam stopper. It shown that superbright data-restoring method virtual enhancement instrument brilliance, improving fringe reaching levels performance comparable third-generation synchrotron radiation beamlines.