Optical module manufacturing and testing systems and methods
作者： Jun Bao
DOI:
关键词:
摘要: The present disclosure relates to streamlining optical module and/or subassembly development, manufacturing, and testing through introducing a memory component within that is utilized with host for system calibration configuration. In an exemplary embodiment, the invention can streamline amplifier (EDFA) testing. includes module/sub-assembly without control circuitry, i.e. “dumb module”, but used load relevant data from supplier. This calibrate, test, configure in module. circuitry access this configure, module/sub-assembly. Advantageously, additional reduces manufacturing time disadvantage of adding complexity
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