Z-SCAN AND EZ-SCAN MEASUREMENTS OF OPTICAL NONLINEARITIES

摘要: We describe the application of single beam propagation methods, namely Z-scan and EZ-scan, for determination nonlinear refractive indices in materials including thin films. In these experiments transmittance a sample is measured either through finite aperture (Z-scan) or around an eclipsing disk (EZ-scan) placed far-field as moved along path (Z) focused beam. Both methods can also be used to separately measure absorption so that both real imaginary parts susceptibility are determined with their signs. The sensitivity induced phase distortion depends on measuring apparatus changes ΔT. For 10 Hz repetition rate Nd:YAG lasers our experiments, we detect ΔT≃10−3. This leads optical length λ/103 λ/104 EZ-scan where λ wavelength. interferometric sensitivity, using beam, allows measurement refraction films without need waveguiding geometry.