Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics

摘要: In this chapter, a built-in self-test procedure is presented for testing and fault tolerance of molecular electronics-based nanoFabrics. The nanoFabrics are assumed to include up 1012 devices/cm2 as high 10% defect density; requires new test strategies that can efficiently diagnose the in reasonable time. BIST shown utilizes nanoFabric’s components small groups containing pattern generator response analyzer. Using will result higher diagnosability recovery. technique applies tests parallel with low number configurations resulting manageable time such large devices. Due density nanoFabrics, an efficient diagnosis must be done after achieve called recovery increase procedure. It increases available fault-free detected nano-chip. Finally, database map created used by compilers during configuring avoid defective components. This results reliable system constructed using unreliable