Comparison Between the Behavior of HTS Thin Film Grown on Sapphire and Coated Conductors for Fault Current Limiter Applications
作者： Louis Antognazza , Mathieu Therasse , Michel Decroux , FranÇois Roy , Bertrand Dutoit
DOI: 10.1109/TASC.2009.2018113
关键词:
摘要: The major drawback for the commercialization of fault current limiter (FCL) made YBCO on sapphire is their expensive price. In recent years, coated conductors (CC) have been extensively developed and, due to lower prices, recently tested limitation application. One weakness these CC very low electric fields they can sustain, typically below 1 V/cm as compared 20-40 observed in films grown sapphire. this field comes certainly from propagation velocities dissipative state, a property which might be correlated with poor thermal behavior architecture materials. Both conductivities Hastelloy substrate and conducting bilayer (superconducting DyBCO Ag layer) influence therefore optimized get best performance. We then investigated electrical during constant pulses above Jc . comparison results obtained shows several differences. CC, flux flow resistivities are 2-3 orders magnitude higher than film quench (of order cm/s). analysed simple adiabatic model.
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