ITO/Au/ITO multilayer thin films for transparent conducting electrode applications
作者： Y.S. Kim , J.H. Park , D.H. Choi , H.S. Jang , J.H. Lee
DOI: 10.1016/J.APSUSC.2007.07.080
关键词:
摘要: … , ITO/Au/ITO films were polycrystalline with an (1 1 0) X-ray diffraction peak, while single ITO … Surface roughness analysis indicated ITO films had a higher average roughness of 1.76 nm…
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