作者: R.W. Guernsey , J.W. Stasiak , P.A. Moskowitz
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摘要: Four cryoinset systems have been constructed; two devoted to chip testing and provide the I/O system for Josephson test vehicles. The application provides most rigorous exercise of system. greatest number cycles between room temperature liquid helium that any cryoinserts has experienced about thirty. Faults are usually at connections adapter. Methods improve cyclability under investigation. cryoinsets proven reliable laboratory instruments.