作者: Ángel R. Páramo , F. Sordo , D. Garoz , O. Peña-Rodríguez , A. Prada
DOI: 10.1016/J.NIMB.2014.12.073
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摘要: Abstract Ion irradiation on dielectric materials produces several processes, such ionization and defect formation followed by a decay governed thermal processes as heat diffusion atomic rearrangement. Finally in the irradiated region mechanical properties are altered, strain stress fields appear, densification takes places other refractive index affected. In order to simulate response of silica swift ion we use methodology based molecular dynamics (MD) finite element methods (FEM). We information from MD obtain local generated an incoming ion. calculate track using FEM. This method provides field along material function fluence. For this work experimental campaign Br ions 5 50 MeV has been done at CMAM accelerator (Madrid). measured observe that for high fluences decreases. The effect density could explain decrease index. check hypothesis our coupling