Quantitative stress/strain mapping during micropillar compression
作者： X. Maeder , W.M. Mook , C. Niederberger , J. Michler
DOI: 10.1080/14786435.2010.505178
关键词:
摘要: Micropillar compression is increasingly used as a method to examine small length-scale mechanical properties since it minimises the strain gradients that are unavoidable during nanoindentation into flat surface. It also simplifies data analysis assumed uniaxial. But how valid this assumption when misalignments in microscale setup generally unavoidable? In order investigate this, stress and tensors of micropillar should be measured compression. To accomplish electron backscatter diffraction (EBSD) mappings were obtained before, after consecutive compressions GaAs inside high-resolution scanning microscope. Elastic corresponding determined from EBSD measurements using cross-correlation technique. The results show von Mises compares well engineering nanoindenter load–displacement data. Even ...
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sci-hub.se 参考文章(24)
E O Hall, An Optical Method for Studying the Deformation of Mild Steel Proceedings of the Physical Society. Section B. ,vol. 63, pp. 724- 726 ,(1950) , 10.1088/0370-1301/63/9/110
W.M. Mook, M.S. Lund, C. Leighton, W.W. Gerberich, Flow stresses and activation volumes for highly deformed nanoposts Materials Science and Engineering A-structural Materials Properties Microstructure and Processing. ,vol. 493, pp. 12- 20 ,(2008) , 10.1016/J.MSEA.2007.08.096
C. Niederberger, W.M. Mook, X. Maeder, J. Michler, In situ electron backscatter diffraction (EBSD) during the compression of micropillars Materials Science and Engineering: A. ,vol. 527, pp. 4306- 4311 ,(2010) , 10.1016/J.MSEA.2010.03.055
Rudy Ghisleni, Karolina Rzepiejewska-Malyska, Laetitia Philippe, Patrick Schwaller, Johann Michler, In situ SEM indentation experiments: Instruments, methodology, and applications Microscopy Research and Technique. ,vol. 72, pp. 242- 249 ,(2009) , 10.1002/JEMT.20677
S. Zaefferer, On the formation mechanisms, spatial resolution and intensity of backscatter Kikuchi patterns. Ultramicroscopy. ,vol. 107, pp. 254- 266 ,(2007) , 10.1016/J.ULTRAMIC.2006.08.007
R. Rabe, J.-M. Breguet, P. Schwaller, S. Stauss, F.-J. Haug, J. Patscheider, J. Michler, Observation of fracture and plastic deformation during indentation and scratching inside the scanning electron microscope Thin Solid Films. ,vol. 469, pp. 206- 213 ,(2004) , 10.1016/J.TSF.2004.08.096
W M Mook, C Niederberger, M Bechelany, L Philippe, J Michler, Compression of freestanding gold nanostructures: from stochastic yield to predictable flow. Nanotechnology. ,vol. 21, pp. 055701- ,(2010) , 10.1088/0957-4484/21/5/055701
Angus J. Wilkinson, Graham Meaden, David J. Dingley, High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity Ultramicroscopy. ,vol. 106, pp. 307- 313 ,(2006) , 10.1016/J.ULTRAMIC.2005.10.001
Johann Michler, Kilian Wasmer, Stephan Meier, Fredrik Östlund, Klaus Leifer, Plastic deformation of gallium arsenide micropillars under uniaxial compression at room temperature Applied Physics Letters. ,vol. 90, pp. 043123- ,(2007) , 10.1063/1.2432277
D. Kiener, C. Motz, G. Dehm, Micro-compression testing: A critical discussion of experimental constraints Materials Science and Engineering A-structural Materials Properties Microstructure and Processing. ,vol. 505, pp. 79- 87 ,(2009) , 10.1016/J.MSEA.2009.01.005