作者: G. G. Kenning , D. L. Schlagel , V. Thompson
DOI: 10.1103/PHYSREVB.102.064427
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摘要: Measuring ThermoRemanent Magnetization (TRM) decays on a single crystal CuMn(6$\%$) spin glass sample, we have systematically mapped the rapid decrease of characteristic timescale $tw_{eff}$ near $T_g$. Using to determine length scale growth correlations during waiting time, $\xi_{TRM}$, (observed in both numerical studies and experiment), observe $\xi_{TRM}$ phase then reduction very close We interpret this for all times, as being governed by critical correlation $\xi_{crit}=a(T-T_c)^{-\nu}$.