Chapter 11 Atomic-Resolution Aberration-Corrected Transmission Electron Microscopy

摘要: This chapter discusses the current state of aberration-corrected transmission electron microscopy (TEM) with an emphasis on atomic-resolution studies in materials science. Atomic-resolution (EM) provides new insight into atomic structures at a time when nanophysics and technology urgently need quantitative information physical phenomena their structural background. In addition, nanotechnology will benefit from ability to analyze detail down picometer range. Understanding offered by waves about inner structure specimen is highly nontrivial task. be underscored greater numbers such ultrahigh-resolution within next few years. These also demonstrate enormous potential optics wonderful science waiting for us “at bottom.”