Analysis of surface defects using a novel developed fiber-optics laser scanning system

摘要: Various methods of determining surface defects are being used in automated industrial manufacturing environments. This work presents the design and development a new high-speed photoelectronic laser scanning system. Recent defect detection involve use fiber-optic light-emitting assemblies. A line five emitting diodes receiving photodiodes were as light sources detectors, respectively. These arrays photodetectors positioned opposite each other. data acquisition card was to capture output signals from photodiodes. Data controlled analysis performed using Labview. The advantages this system may be seen faster detection, lower cost greater resolution. Such will also occupy less space than conventional scanners. detected examined measure dimensions defects, such holes, blind holes for different materials.