Method, apparatus and system providing adjustment of pixel defect map
作者： Igor Subbotin
DOI:
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摘要: A method, apparatus and system that allows for the identification of defective pixels, example, pixel clusters, in an imager device. The determine, during use device, a defect, e.g., cluster exists accurately maps location pixel. By analyzing more than one frame image, method increases accuracy defect mapping, which is used to improve quality resulting image data.
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