One-step deconvolution for multi-angle TIRF microscopy with enhanced resolution
作者： Junchao Fan , Xiaoshuai Huang , Liuju Li , Liangyi Chen , Shan Tan
关键词:
摘要: Total internal reflection fluorescence microscopy (TIRF microscopy) uses a rapid decay of evanescent waves to excite fluorophores within several hundred nanometers (nm) beneath the plasma membrane, which can effectively suppress excitation signals in deep layers. From image stacks obtained with plurality different incident angles, three-dimensional spatial structure observed sample be reconstructed by Multi-Angle-TIRF (MA-TIRF) algorithm that provides an axial resolution ~50 nm. Taking into account point spread function (PSF) TIRF microscopes, we further increase its lateral introducing fast deconvolution reconstruction MA-TIRF data (DMA-TIRF), is approached just one step minimizing function. We also introduce TV regularization term artifacts induced excessive noise. Therefore, based on hardware existing proposed DMA-TIRF has achieved and resolutions ~200 nm, respectively.
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