Method for event-related functional testing of a microprocessor

摘要: A method is presented for event-related functional testing of a microprocessor. model the microprocessor adapted to produce trigger event, perform target activity, and respond control signal. The activity occurs over several system clock signal cycles. generator receives event generates selectable number cycles (i.e., delay time) after event. program includes loop which causes test result, compare result an expected result. repeatedly executed until responds during each cycle activity. If matches execution loop, properly may be software or hardware implementation. Software embodiments bus model, memory engine provide operating environment model. central processing unit (CPU), chip set logic, bus, unit. In first embodiment system, reside within second embodiment, separate