Potential data loss due to head/disk contacts during dynamic load/unload
作者： M. Suk , D. Jen
DOI: 10.1109/20.706680
关键词:
摘要: A functioning IBM drive was converted into a component load/unload tester in order to determine the consequence of full-speed loading and unloading slider on top magnetic data. Tests using this apparatus show that disk scratch damage produced by is necessary but not sufficient result defects are detectable surface analysis test. Comparison AFM sites with MFM surrounding data bits shows loss results from physical any magnetostriction effect negligible.
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