作者: Shashank Shekhar , Duckhyung Cho , Hyungwoo Lee , Dong-guk Cho , Seunghun Hong
DOI: 10.1039/C5NR06896G
关键词:
摘要: The localized noise-sources and those induced by external-stimuli were directly mapped using a conducting-AFM integrated with custom-designed noise measurement set-up. In this method, current images of poly(9,9-dioctylfluorene)-polymer-film on conducting-substrate recorded simultaneously, enabling the mapping resistivity source density (NT). polymer-films exhibited separate regions high or low resistivities, which attributed to ordered disordered phases, respectively. A larger number observed in disordered-phase-regions than ordered-phase regions, due structural disordering. Increased bias-voltages resulted increased NT, is explained deformation at bias-voltages. On photo-illumination, ordered-phase-regions rather large increase conductivity NT. Presumably, illumination released carriers from deep-traps should work as additional noise-sources. These results show that our methods provide valuable insights into and, thus, can be powerful tools for basic research practical applications conducting polymer films.