作者: Rajesh Swaminathan , Cyril Robinson Azariah John Chelliah , Sheebha Immanuel
DOI: 10.1007/S10854-021-05782-0
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摘要: The paper presents the preparation of nanostructured ZnO and TiO2 binary thin films by pulsed laser deposition at different temperatures ranging from 298 K (as deposited) to 923 K. have been characterized by SEM, EDAX, XRD, UV. presence nanospheres is detected SEM. XRD spectra extrapolates film's amorphous existence below 773 Thin film deposited confirmed ZnTiO3 formation. optical energy band gap measured Tauc plot was found be 3.7–3.9 eV. electrochemical impedance spectroscopy with a sweeping frequency 1 Hz MHz used examine for between 473 EIS results revealed that these not denied an modulus relaxation. Activation dependent on module relaxation calculated Arrhenius plot. mean capacitance obtained statistically tested using SPSS statistics software tool.