作者: D. H. Kim , S. S. Kim , H. H. Lee , H. W. Jang , J. W. Kim
DOI: 10.1021/JP0479062
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摘要: The growth kinetics of passive films on iron and stainless steel (Fe−16.31%Cr) substrates in pH 8.4 borate buffer solution was investigated by using situ specular X-ray reflectivity. oxide rate decays exponentially with increasing thickness consistent the point defect model which electric field is maintained constant during growth. In steel, however, depends strongly applied potential, indicating that properties change as potential varies. Using observed saturation a quasi steady state, we estimate drop at metal/oxide interface, oxide, oxide/solution interface.