作者: Chang Jung Kim , Soon Gu Hong
DOI: 10.1016/S0040-6090(00)00654-4
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摘要: Abstract The ferroelectric properties of the bismuth titanate niobate Bi 7 Ti 4 NbO 21 thin film have been studied. was successfully fabricated on platinized Si substrates by chemical solution deposition method. crystallization observed using an X-ray diffraction analysis (XRD). hysteresis loop a standardized test system. exhibits with remnant polarization P r =5.65 μC/cm 2 and coercive field E c =127 kV/cm.