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sci-hub.se 参考文章(72)
J.N. Hilfiker, In situ spectroscopic ellipsometry (SE) for characterization of thin film growth In Situ Characterization of Thin Film Growth. pp. 99- 151 ,(2011) , 10.1533/9780857094957.2.99
M. Fried, T. Lohner, P. Petrik, Chapter 6 – ELLIPSOMETRIC CHARACTERIZATION OF THIN FILMS Handbook of Surfaces and Interfaces of Materials. pp. 335- 367 ,(2001) , 10.1016/B978-012513910-6/50052-9
Robert M. Braun, Juan Cheng, Edward E. Parsonage, Jeff Moeller, Nicholas Winograd, Surface and Depth Profiling Investigation of a Drug-Loaded Copolymer Utilized To Coat Taxus Express2 Stents Analytical Chemistry. ,vol. 78, pp. 8347- 8353 ,(2006) , 10.1021/AC0615089
Zhi Min Ao, Qing Jiang, Size Effects on Miscibility and Glass Transition Temperature of Binary Polymer Blend Films Langmuir. ,vol. 22, pp. 1241- 1246 ,(2006) , 10.1021/LA0516779
S.S. Sharma, B. Tripathi, M. Singh, D. Bhatnagar, Y.K. Vijay, Junction characteristics of C60/polycarbonate blend on Si substrate Applied Surface Science. ,vol. 255, pp. 7070- 7072 ,(2009) , 10.1016/J.APSUSC.2009.03.060
Ali Rafati, Martyn C. Davies, Alexander G. Shard, Simon Hutton, Gautam Mishra, Morgan R. Alexander, Quantitative XPS depth profiling of codeine loaded poly(l-lactic acid) films using a coronene ion sputter source. Journal of Controlled Release. ,vol. 138, pp. 40- 44 ,(2009) , 10.1016/J.JCONREL.2009.05.005
Richard R. Grote, Steven J. Brown, Jeffrey B. Driscoll, Richard M. Osgood, Jon A. Schuller, Morphology-dependent light trapping in thin-film organic solar cells Optics Express. ,vol. 21, ,(2013) , 10.1364/OE.21.00A847
Bong Sup Kim, Tsuneo Chiba, Takashi Inoue, Phase separation and apparent phase dissolution during cure process of thermoset/thermoplastic blend Polymer. ,vol. 36, pp. 67- 71 ,(1995) , 10.1016/0032-3861(95)90676-S
Tobias Erb, Uladzimir Zhokhavets, Harald Hoppe, Gerhard Gobsch, Maher Al-Ibrahim, Oliver Ambacher, Absorption and crystallinity of poly(3-hexylthiophene)/fullerene blends in dependence on annealing temperature Thin Solid Films. ,vol. 511, pp. 483- 485 ,(2006) , 10.1016/J.TSF.2005.12.064
G.E. Jellison, Data analysis for spectroscopic ellipsometry Thin Solid Films. ,vol. 234, pp. 416- 422 ,(1993) , 10.1016/0040-6090(93)90298-4