Surface photovoltage spectroscopy on semiconductor surfaces
作者： H. Lüth , G. Heiland
DOI: 10.1007/BF02725820
关键词:
摘要: Surface photovoltage (SPV) spectroscopy is discussed with respect to its application for the investigation of semiconductor surfaces. Principles method and experimental equipment are presented. As examples study surface states, recent results on ultrahigh-vacuum (UHV) cleaved surfaces Ge, Si, GaAs ZnO briefly reviewed.
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