Determination of surface states in hydrogenated amorphous silicon by subgap absorption measurements
作者： A. K. Sinha , S. C. Agarwal
DOI: 10.1080/13642819808206396
关键词:
摘要: Constant-photocurrent measurement and photothermal deflection spectroscopy have been used as complementary techniques to measure the density of surface states in hydrogenated amorphous silicon (a-S...
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sci-hub.se 参考文章(22)
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