Tip contamination effects in ambient pressure scanning tunneling microscopy imaging of graphite

作者: T. Tiedje , J. Varon , H. Deckman , J. Stokes

DOI: 10.1116/1.575418

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摘要: … microscopy to study the condition of metal tips used to obtain contrast current mode scanning tunneling microscope … Clean atomic-resolution tips formed by sputtering thin layers of metal …

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