Missing spots in rheed patterns from the Si(111)(6 X 1)-Ag surface structure
作者： Toshihiro Ichikawa , Shozo Ino
DOI: 10.1016/0039-6028(80)90681-0
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摘要: Abstract Some of the 1 6 -order superlattice spots in RHEED patterns from Si(111)(6 × 1)-Ag surface structure exhibit a peculiar feature that they are visible when primary electron beam is incident 〈112〉 azimuth, but missing 〈110〉 incidence azimuth. This can be interpreted by double diffraction enhanced through excitation waves. The interpretation reveals has twofold glide planes. Two structural models for proposed, and general analysis intensity given.
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