Modelling and performance study of monolithically integrated deple-tion type Silicon IQ modulators

作者: Benjamin Wohlfeil , Bernhard Schmauss , Pedro Rito , Lars Zimmermann , Joerg-Peter Elbers

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摘要: We report on an analytical model for monitoring the bias condition of Silicon IQ modulators. Based measured phase modulator behavior, ohmic heaters and transfer functions, transmitter performance investigation is attained versus applied voltages. underline error vector magnitude quadrature as appropriate metrics quality measurements coherent transmitters.

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