Spatial Resolution and Minimum Detection
作者： David B. Williams , C. Barry Carter
DOI: 10.1007/978-0-387-76501-3_36
关键词:
摘要: Often when you do X-ray analysis of thin foils are seeking information that is close to the limits spatial resolution. Before carry out any such need understand various controlling factors and in this chapter we explain these. Minimizing your specimen thickness perhaps most critical aspect obtaining best resolution, so summarize ways can measure foil at point, but quality TEM-XEDS system also important.
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David C. Joy, Monte Carlo Modeling for Electron Microscopy and Microanalysis ,(1995)
I. P. Jones, Chemical microanalysis using electron beams Institute of Materials. ,(1992)
D.B. Williams, J.R. Michael, J.I. Goldstein, A.D. Romig, Definition of the Spatial Resolution of X-Ray Microanalysis in Thin Foils Ultramicroscopy. ,vol. 47, pp. 121- 132 ,(1992) , 10.1016/0304-3991(92)90189-Q
Katsunori Ohshima, Kenji Kaneko, Takeshi Fujita, Zenji Horita, Determination of absolute thickness and mean free path of thin foil specimen by ζ-factor method Journal of Electron Microscopy. ,vol. 53, pp. 137- 142 ,(2004) , 10.1093/JMICRO/53.2.137
Lloyd A. Currie, LIMITS FOR QUALITATIVE DETECTION AND QUANTITATIVE DETERMINATION. APPLICATION TO RADIOCHEMISTRY. Analytical Chemistry. ,vol. 40, pp. 586- 593 ,(1968) , 10.1021/AC60259A007
Thomas O. Ziebold, Precision and sensitivity in electron microprobe analysis Analytical Chemistry. ,vol. 39, pp. 858- 861 ,(1967) , 10.1021/AC60252A028
J. Berriman, R.K. Bryan, R. Freeman, K.R. Leonard, Methods for specimen thickness determination in electron microscopy. Ultramicroscopy. ,vol. 13, pp. 351- 364 ,(1984) , 10.1016/0304-3991(84)90001-9
T. Malis, S. C. Cheng, R. F. Egerton, EELS Log-Ratio Technique for Specimen-Thickness Measurement in the TEM Journal of Electron Microscopy Technique. ,vol. 8, pp. 193- 200 ,(1988) , 10.1002/JEMT.1060080206
J. R. Michael, D. B. Williams, C. F. Klein, R. Ayer, The measurement and calculation of the X‐ray spatial resolution obtained in the analytical electron microscope Journal of Microscopy. ,vol. 160, pp. 41- 53 ,(1990) , 10.1111/J.1365-2818.1990.TB03046.X
M Watanabe, D.B Williams, Atomic-level detection by X-ray microanalysis in the analytical electron microscope Ultramicroscopy. ,vol. 78, pp. 89- 101 ,(1999) , 10.1016/S0304-3991(99)00015-7