作者: W. R. BUESSEM , MANFRED KAHN
DOI: 10.1111/J.1151-2916.1971.TB12385.X
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摘要: Measurements of Nb diffusion into large- and small-grained BaTiO3 disks show a high ratio grain boundary to bulk diffusivity. Well defined X-ray diffraction lines are found in Nb-doped only when significant growth occurs during sintering. When 0.65 μm size powder is limited at ∼1 μm, excess line broadening results. This attributed the simultaneous presence Nb-free Nb-rich regions. Because its low diffusivity little penetrates original cores, solid solution forms regions recrystallization. limited, “sintering reaction” results non-homogeneous system; appreciable occurs, most cores eliminated an essentially uniform system obtained.