WVM: A computer program for the determination of lattice parameters and strains in thin films
作者： Thomas Wieder
DOI: 10.1016/0010-4655(96)00055-0
关键词:
摘要: X-ray diffraction provides a method for the determination of strain and stress tensor in polycrystalline sample. The knowledge unstrained lattice parameters is prerequisite to calculate strains from measured reflection shifts. For thin films model exists find or together positions.
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