作者: Y. Zhu , M. Suenaga , Youwen Xu , R. L. Sabatini , A. R. Moodenbaugh
DOI: 10.1063/1.101349
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摘要: Using an electron diffraction technique, the thicknesses of (nonorthorhombic) twin boundary layers were measured for pure and alloyed YBa2(Cu1−xMx)3O7−δ. Boundary thickness varied from ∼0.7 nm M=Ni, x=0.02, δ≂0 to ∼2.6 M=Al, δ≂0, while it was ∼1.0 a YBa2Cu3O7. High‐resolution transmission imaging similar specimens supports existence such layers.