Locating an affine/projective invariant identifier patch on an image
作者： N Kehtarnavaz , BN Araabi , M Yeary , G Hillman , B Würsig
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摘要: Single view recognition is encountered in many photo-identification applications. Often a query image retrieved by searching database of previously identified images. Important markings and patterns are often located particular area the object. This paper presents method to locate an invariant patch on using few points correspondence ratios. Computation ratios simple intuitive both geometrically analytically. Once computed for appropriate multilateral patch, same can be used other images identifier patch. In particular, this deployed obtain interest spotted dolphins.
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