作者: R.G. Pavelko , F. Gispert-Guirado , E. Llobet
DOI: 10.1016/J.SSI.2013.11.028
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摘要: Abstract Parametric line profile analysis has been used to separate size and strain contributions the peak broadening of in situ X-ray diffractograms recorded during isothermal annealing nanocrystalline SnO 2 materials. Of five kinetic models for crystallite growth, simplified generalised parabolic model was found be closest transmission electron microscopy (TEM) sizes resulting expected (exponential) relaxation strain. Crystallite growth evolution pure Pd-doped compared discussed regarding possible mechanisms. It shown that lattice strain, despite being very low, leads overestimation activation energy if not considered integral breadth analysis.