Modeling the Relationship Between Alternaria Leaf Blight and Yield Loss in Muskmelon

摘要: Empirical models were developed to describe an observed relationship between Alternaria leaf blight and yield loss in muskmelon. Data used develop validate the obtained from replicated experimental field plots at two locations 1988 1991. Area under disease progress curve, critical-point, multiple-point derived evaluated. All provided a reasonably good fit data. However, single area curve model described losses both locations, whereas separate critical-point necessary for each location (.)