High frequency transmission to a junction of a scanning tunneling microscope
作者： M. Hervé , M. Peter , W. Wulfhekel
DOI: 10.1063/1.4929766
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摘要: We report on an easy method to calibrate the transmission of radio-frequency (rf) voltages tunneling junction a scanning microscope. The strongly depends frequency, as cabling shows frequency dependent damping and impedance mismatch between cable induces reflections. To first order, current-voltage characteristic rf current same voltage. Omnipresent non-linearities second however, generate additional rectified DC. A direct comparison this derivative curve allows determine junction. data up 2 GHz were used compensate such that at every constant amplitude could be realized expanding bandwidth experiment from less then 100 MH...
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