Photoelectron spectroscopy of chromium-doped silicon cluster anions
作者： Weijun Zheng , J Michael Nilles , Dunja Radisic , Kit H Bowen , None
DOI: 10.1063/1.1851984
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摘要: The photoelectron spectra of chromium-doped silicon cluster anions, CrSin−, were measured over the size range, n=8–12. Their vertical detachment energies to be 2.71, 2.88, 2.87, 2.95, and 3.18eV, respectively. Our results support theoretical calculations by Khanna, Rao, Jena [Phys. Rev. Lett. 89, 016803 (2002)] which found CrSi12 an enhanced stability (magic) with its chromium atom encapsulated inside a cage magnetic moment completely quenched effects surrounding cage.
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