Properties of electrophoretically deposited single wall carbon nanotube films

摘要: Abstract This paper describes techniques for rapidly producing a carbon nanotube thin film by electrophoretic deposition at room temperature and determines the mass density electrical/mechanical properties of such films. The mechanism layers is explained with experimental data. Also, thickness measured as function time, electrical field suspension concentration. We use Rutherford backscattering spectroscopy to determine density. Films created in this manner have resistivity 2.14 × 10 − 3  Ω·cm, that varies from 0.12 0.54 g/cm 3 , Young's modulus between 4.72 5.67 GPa. latter was found be independent 77 134 nm. also report on fabricating free-standing films removing metal seed layer under CNT film, selectively etching sacrificial layer. method could extended flexible photovoltaic devices or high frequency RF MEMS devices.