Expert Systems and Diagnostic Expertise in the Mechanical and Electrical Domains

作者: Pamela K. Fink , John C. Lusth

DOI: 10.1109/TSMC.1987.4309051

关键词:

摘要: Current expert system technology tends to rely on the use of shallow empirically based experiential knowledge. With only this type knowledge available, systems have been capable reaching a high level agreement with human experts in limited area expertise. However, due nature their knowledge, such fall short expertise many ways. The diagnostic process is examined as it relates malfunction mechanical and electrical devices. An design presented, called integrated model (IDM), that attempts address some issues involved bridging gap between computer IDM contains two different types one experience how device be diagnosed functions. These are used together during session determine what wrong device. To demonstrate works, an interaction prototype was built using described; then research extensions discussed.

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